Create a defect log mapping intermittent PCIe bus timeout defects to specific motherboard revision levels and BIOS versions in custom embedded board designs

Test Log Files *

Motherboard Revision * Select PCB revision... Rev 1.0 - Initial production release Rev 1.1 - Manufacturing optimization Rev 1.2 - Clock routing improvements Rev 2.0 - Silicon refresh with new chipset Rev 2.1 - PCIe lane optimization Rev 2.2 - Power distribution enhancement Rev 3.0 - Major redesign with PCIe 4.0 support Engineering Sample - Pre-release validation Custom rev A - Customer-specific variant Custom rev B - Second customer iteration

BIOS Firmware Versions *

PCIe Device Configuration * Choose device category... NVMe SSD - Single lane x4 NVMe SSD - Dual controller array 10GbE Network Interface Card 25GbE SFP28 NIC GPU - Single slot x16 GPU - Multi-GPU x8/x8 bifurcation FPGA Accelerator Card RAID Controller - HW RAID card Wireless NIC - Wi-Fi 6/6E Thunderbolt Controller USB 3.2 Gen2x2 Controller SAS HBA - Storage controller

Timeout Failure Mode * Select failure classification... Completion Timeout (CTO) - No response Replay Timer Timeout - TL packet loss DLLP ACK Timeout - Data link layer failure PME Turnoff Timeout - Power management L0s/L1 Exit Timeout - Link state transitions AER Correctable Error - Recoverable timeout AER Uncorrectable Error - Fatal timeout ACS Violation Timeout - Access control ECRC Error Timeout - End-to-end CRC Surprise Down Timeout - Unexpected link down

Test Environment Parameters *

Production Volume Impact * Choose production scale... Prototype - Less than 5 units Pilot Run - 5-50 units Low Volume - 50-500 units Medium Volume - 500-5000 units High Volume - 5000-50000 units Mass Production - 50000+ units Critical Infrastructure - Single high-value system Defense/Aerospace - ITAR controlled quantity

Compliance Requirements * Choose compliance framework... ISO 9001 - Quality Management Standard IEC 61508 - Functional Safety IPC-A-610 - Acceptability of Electronic Assemblies DO-254 - Avionics Hardware Design MIL-STD-810 - Environmental Testing CE Marking - EU Conformity FCC Part 15 - EMI Compliance AS9100 - Aerospace Quality Standard ISO 13485 - Medical Device Quality Automotive ISO 26262 - Functional Safety Industrial IEC 62304 - Software Lifecycle Semiconductor JEDEC Standards

Subsystem Interdependencies

Customer Impact Priority * Choose business priority... P0 - Data loss or system crash in production P1 - Performance degradation affecting SLA P2 - Intermittent failure under stress testing P3 - Corner case in validation only T0 - Customer release blocker T1 - Next release required fix T2 - Future release candidate T3 - Documentation/tracking only

Root Cause Investigation Notes